Information card for entry 1575220

Structure parameters

• Formula: C56 H54 N2 O6 Si
• Calculated formula: C56 H54 N2 O6 Si
• Title of publication: What distinguishes the strength and the effect of a Lewis base: insights with a strong chromogenic silicon Lewis acid.
• Authors of publication: Stoess, Lennart; Greb, Lutz
• Journal of publication: Chemical science
• Year of publication: 2025
• Journal volume: 16
• Journal issue: 34
• Pages of publication: 15387 - 15395
• a: 8.9542 ± 0.0005 Å
• b: 14.7938 ± 0.0008 Å
• c: 20.8352 ± 0.0011 Å
• α: 106.669 ± 0.002°
• β: 93.269 ± 0.002°
• γ: 90.445 ± 0.002°
• Cell volume: 2638.8 ± 0.2 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0711
• Residual factor for significantly intense reflections: 0.0613
• Weighted residual factors for significantly intense reflections: 0.1615
• Weighted residual factors for all reflections included in the refinement: 0.1677
• Goodness-of-fit parameter for all reflections included in the refinement: 1.086
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No