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Information card for entry 1575221
Preview
| Coordinates | 1575221.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C84.5 H111 Cl6 N2 O6 P Si |
|---|---|
| Calculated formula | C84.501 H111.002 Cl6.002 N2 O6 P Si |
| Title of publication | What distinguishes the strength and the effect of a Lewis base: insights with a strong chromogenic silicon Lewis acid. |
| Authors of publication | Stoess, Lennart; Greb, Lutz |
| Journal of publication | Chemical science |
| Year of publication | 2025 |
| Journal volume | 16 |
| Journal issue | 34 |
| Pages of publication | 15387 - 15395 |
| a | 15.0843 ± 0.0017 Å |
| b | 15.9059 ± 0.0017 Å |
| c | 20.643 ± 0.002 Å |
| α | 108.857 ± 0.004° |
| β | 95.289 ± 0.004° |
| γ | 114.939 ± 0.003° |
| Cell volume | 4096.6 ± 0.8 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1813 |
| Residual factor for significantly intense reflections | 0.1148 |
| Weighted residual factors for significantly intense reflections | 0.2872 |
| Weighted residual factors for all reflections included in the refinement | 0.3177 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1575221.html
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Users of the data should acknowledge the original authors of the
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