Information card for entry 1575222

Structure parameters

• Formula: C83.92 H81.84 Cl8.84 N2 O6 P Si
• Calculated formula: C83.918 H81.836 Cl8.836 N2 O6 P Si
• Title of publication: What distinguishes the strength and the effect of a Lewis base: insights with a strong chromogenic silicon Lewis acid.
• Authors of publication: Stoess, Lennart; Greb, Lutz
• Journal of publication: Chemical science
• Year of publication: 2025
• Journal volume: 16
• Journal issue: 34
• Pages of publication: 15387 - 15395
• a: 23.7594 ± 0.0015 Å
• b: 12.8395 ± 0.0008 Å
• c: 27.154 ± 0.0016 Å
• α: 90°
• β: 101.651 ± 0.002°
• γ: 90°
• Cell volume: 8112.9 ± 0.9 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0672
• Residual factor for significantly intense reflections: 0.0507
• Weighted residual factors for significantly intense reflections: 0.1242
• Weighted residual factors for all reflections included in the refinement: 0.1357
• Goodness-of-fit parameter for all reflections included in the refinement: 1.037
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No