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Information card for entry 1575458
Preview
| Coordinates | 1575458.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Ni(SiMe2Ph)(Bpin)(iPrIM)2 |
|---|---|
| Formula | C32 H55 B N4 Ni O2 Si |
| Calculated formula | C32 H55 B N4 Ni O2 Si |
| Title of publication | Reactivity of a <i>cis</i>-(silyl)(boryl) moiety with a nickel center involving the oxidative addition and reductive elimination of a silylborane. |
| Authors of publication | Suga, Yuto; Sunada, Yusuke |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2025 |
| Journal volume | 61 |
| Journal issue | 75 |
| Pages of publication | 14370 - 14373 |
| a | 10.7704 ± 0.0005 Å |
| b | 18.1839 ± 0.0007 Å |
| c | 18.7207 ± 0.0006 Å |
| α | 90° |
| β | 94.687 ± 0.004° |
| γ | 90° |
| Cell volume | 3654.1 ± 0.3 Å3 |
| Cell temperature | 297 K |
| Ambient diffraction temperature | 297 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1099 |
| Residual factor for significantly intense reflections | 0.0549 |
| Weighted residual factors for significantly intense reflections | 0.1017 |
| Weighted residual factors for all reflections included in the refinement | 0.1156 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.01 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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