Information card for entry 1575766

Structure parameters

• Formula: C44 H48 N4 Ni2 O4 Si2
• Calculated formula: C44 H48 N4 Ni2 O4 Si2
• Title of publication: N-Heterocyclic silylene complexes of nickel(0).
• Authors of publication: Glok, Eduard; Werner, Luis; Radius, Udo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2025
• Journal volume: 54
• Journal issue: 39
• Pages of publication: 14846 - 14861
• a: 11.481 ± 0.0002 Å
• b: 13.253 ± 0.0002 Å
• c: 15.913 ± 0.0003 Å
• α: 92.719 ± 0.001°
• β: 109.784 ± 0.001°
• γ: 108.3 ± 0.001°
• Cell volume: 2130.88 ± 0.07 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0625
• Residual factor for significantly intense reflections: 0.0569
• Weighted residual factors for significantly intense reflections: 0.1492
• Weighted residual factors for all reflections included in the refinement: 0.1536
• Goodness-of-fit parameter for all reflections included in the refinement: 1.035
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No