Information card for entry 1575767

Structure parameters

• Formula: C45 H48 N4 Ni3 O5 Si2
• Calculated formula: C45 H48 N4 Ni3 O5 Si2
• Title of publication: N-Heterocyclic silylene complexes of nickel(0).
• Authors of publication: Glok, Eduard; Werner, Luis; Radius, Udo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2025
• Journal volume: 54
• Journal issue: 39
• Pages of publication: 14846 - 14861
• a: 11.3997 ± 0.0003 Å
• b: 13.6548 ± 0.0003 Å
• c: 16.3338 ± 0.0004 Å
• α: 91.846 ± 0.002°
• β: 108.99 ± 0.002°
• γ: 110.077 ± 0.002°
• Cell volume: 2228.21 ± 0.11 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0845
• Residual factor for significantly intense reflections: 0.0688
• Weighted residual factors for significantly intense reflections: 0.1891
• Weighted residual factors for all reflections included in the refinement: 0.2018
• Goodness-of-fit parameter for all reflections included in the refinement: 1.033
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No