Information card for entry 2003504
| Chemical name |
3-methyl-4H-pyrido[3,2-e][1,2,4]thiadiazine 1,1-dioxide |
| Formula |
C7 H7 N3 O2 S |
| Calculated formula |
C7 H7 N3 O2 S |
| SMILES |
S1(=O)(=O)N=C(Nc2cccnc12)C |
| Title of publication |
3-Methyl-4<i>H</i>-pyrido[3,2-<i>e</i>][1,2,4]thiadiazine 1,1-Dioxide |
| Authors of publication |
Dupont, L.; Pirotte, B.; de Tullio, P.; Masereel, B.; Delarge, J. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1995 |
| Journal volume |
51 |
| Journal issue |
5 |
| Pages of publication |
944 - 946 |
| a |
20.709 ± 0.003 Å |
| b |
7.777 ± 0.0014 Å |
| c |
17.276 ± 0.003 Å |
| α |
90° |
| β |
143.279 ± 0.005° |
| γ |
90° |
| Cell volume |
1663.6 ± 0.5 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
9 |
| Hermann-Mauguin space group symbol |
C 1 c 1 |
| Hall space group symbol |
C -2yc |
| Residual factor for all reflections |
0.0274 |
| Residual factor for significantly intense reflections |
0.0268 |
| Weighted residual factors for all reflections |
0.0693 |
| Weighted residual factors for significantly intense reflections |
0.0691 |
| Goodness-of-fit parameter for all reflections |
1.108 |
| Goodness-of-fit parameter for significantly intense reflections |
1.117 |
| Diffraction radiation wavelength |
1.5418 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/2003504.html