Information card for entry 2007322
| Formula |
C18 H2 F16 |
| Calculated formula |
C18 H2 F16 |
| SMILES |
Fc1c(F)c2c3c(F)c(F)c(c(c3ccc2c(c1C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F |
| Title of publication |
3,4,5,6-Tetrafluoro-1,2,7,8-tetrakis(trifluoromethyl)phenanthrene and 3,4,7,8-Tetrafluoro-1,2,5,6-tetrakis(trifluoromethyl)anthracene |
| Authors of publication |
Swenson, Dale C.; Yamamoto, Michiharu; Burton, Donald J. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1998 |
| Journal volume |
54 |
| Journal issue |
6 |
| Pages of publication |
846 - 849 |
| a |
8.291 ± 0.001 Å |
| b |
26.735 ± 0.005 Å |
| c |
8.567 ± 0.001 Å |
| α |
90° |
| β |
114.49 ± 0.02° |
| γ |
90° |
| Cell volume |
1728.1 ± 0.5 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
291 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.08 |
| Residual factor for significantly intense reflections |
0.044 |
| Weighted residual factors for all reflections |
0.14 |
| Weighted residual factors for significantly intense reflections |
0.11 |
| Goodness-of-fit parameter for all reflections |
1.1 |
| Goodness-of-fit parameter for significantly intense reflections |
1.065 |
| Diffraction radiation wavelength |
0.7107 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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https://www.crystallography.net/2007322.html