Information card for entry 2007323
| Formula |
C18 H2 F16 |
| Calculated formula |
C18 H2 F16 |
| SMILES |
Fc1c(F)c2cc3c(cc2c(c1C(F)(F)F)C(F)(F)F)c(F)c(c(c3C(F)(F)F)C(F)(F)F)F |
| Title of publication |
3,4,5,6-Tetrafluoro-1,2,7,8-tetrakis(trifluoromethyl)phenanthrene and 3,4,7,8-Tetrafluoro-1,2,5,6-tetrakis(trifluoromethyl)anthracene |
| Authors of publication |
Swenson, Dale C.; Yamamoto, Michiharu; Burton, Donald J. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1998 |
| Journal volume |
54 |
| Journal issue |
6 |
| Pages of publication |
846 - 849 |
| a |
8.268 ± 0.001 Å |
| b |
8.469 ± 0.002 Å |
| c |
8.274 ± 0.002 Å |
| α |
126.06 ± 0.02° |
| β |
110.62 ± 0.02° |
| γ |
90.19 ± 0.02° |
| Cell volume |
421 ± 0.2 Å3 |
| Cell temperature |
291 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.045 |
| Residual factor for significantly intense reflections |
0.036 |
| Weighted residual factors for all reflections |
0.117 |
| Weighted residual factors for significantly intense reflections |
0.104 |
| Goodness-of-fit parameter for all reflections |
1.11 |
| Goodness-of-fit parameter for significantly intense reflections |
1.112 |
| Diffraction radiation wavelength |
0.7107 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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https://www.crystallography.net/2007323.html