Information card for entry 2008894
| Chemical name |
1,2,3,4,5,6,7,8-octahydro-3,3,6,6-tetramethylxanthen-1,8-dione |
| Formula |
C17 H22 O3 |
| Calculated formula |
C17 H22 O3 |
| SMILES |
O=C1CC(CC2=C1CC1=C(CC(CC1=O)(C)C)O2)(C)C |
| Title of publication |
Two tetramethylxanthenediones |
| Authors of publication |
Jeyakanthan, J.; Shanmuga Sundara Raj, S.; Velmurugan, D.; Hoong-Kun Fun; Murugan, P. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1999 |
| Journal volume |
55 |
| Journal issue |
9 |
| Pages of publication |
1515 - 1517 |
| a |
7.1458 ± 0.0008 Å |
| b |
9.769 ± 0.0012 Å |
| c |
11.886 ± 0.002 Å |
| α |
110.784 ± 0.01° |
| β |
96.074 ± 0.011° |
| γ |
101.302 ± 0.01° |
| Cell volume |
746.65 ± 0.19 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.066 |
| Residual factor for significantly intense reflections |
0.044 |
| Weighted residual factors for all reflections |
0.139 |
| Weighted residual factors for significantly intense reflections |
0.123 |
| Goodness-of-fit parameter for all reflections |
0.994 |
| Goodness-of-fit parameter for significantly intense reflections |
1.131 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/2008894.html