Information card for entry 2008895
| Chemical name |
1,2,3,4,5,6,7,8-octahydro-3,3,6,6-tetramethyl-9-(2-nitrophenyl)xanthen-1,8- dione |
| Formula |
C23 H25 N O5 |
| Calculated formula |
C23 H25 N O5 |
| SMILES |
N(=O)(=O)c1c(C2C3=C(CC(CC3=O)(C)C)OC3=C2C(=O)CC(C3)(C)C)cccc1 |
| Title of publication |
Two tetramethylxanthenediones |
| Authors of publication |
Jeyakanthan, J.; Shanmuga Sundara Raj, S.; Velmurugan, D.; Hoong-Kun Fun; Murugan, P. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1999 |
| Journal volume |
55 |
| Journal issue |
9 |
| Pages of publication |
1515 - 1517 |
| a |
26.581 ± 0.002 Å |
| b |
10.094 ± 0.001 Å |
| c |
19.624 ± 0.002 Å |
| α |
90° |
| β |
128.75 ± 0.01° |
| γ |
90° |
| Cell volume |
4106.3 ± 0.9 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.156 |
| Residual factor for significantly intense reflections |
0.043 |
| Weighted residual factors for all reflections |
0.107 |
| Weighted residual factors for significantly intense reflections |
0.081 |
| Goodness-of-fit parameter for all reflections |
0.74 |
| Goodness-of-fit parameter for significantly intense reflections |
0.986 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/2008895.html