Information card for entry 2219752

Structure parameters

• Chemical name: Tetrakis(μ-naphthalene-1-acetato-1:2κ^2^O:O')bis(naphthalene-1-acetato)-\ 1κ^2^O,O';2κ^2^O,O'-bis(1,10-phenanthroline)-1κ^2^N,N';2κ^2^N,N'-\ europium(III)samarium(III)
• Formula: C96 H70 Eu N4 O12 Sm
• Calculated formula: C96 H70 Eu N4 O12 Sm
• Title of publication: Tetrakis(μ-naphthalene-1-acetato-1:2κ^2^<i>O</i>:<i>O</i>')bis(naphthalene-1-acetato)-1κ^2^<i>O</i>,<i>O</i>';2κ^2^<i>O</i>,<i>O</i>'-bis(1,10-phenanthroline)-1κ^2^<i>N</i>,<i>N</i>';2κ^2^<i>N</i>,<i>N</i>'-europium(III)samarium(III)
• Authors of publication: Xia, Hai-Tao; Liu, Yu-Fen; Chen, Liang; Wang, Da-Qi
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2008
• Journal volume: 64
• Journal issue: 11
• Pages of publication: m1419 - m1420
• a: 11.9803 ± 0.0018 Å
• b: 12.4116 ± 0.0019 Å
• c: 15.041 ± 0.003 Å
• α: 76.333 ± 0.003°
• β: 74.517 ± 0.003°
• γ: 66.768 ± 0.002°
• Cell volume: 1958.8 ± 0.6 ų
• Cell temperature: 298 ± 2 K
• Ambient diffraction temperature: 298 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0833
• Residual factor for significantly intense reflections: 0.0515
• Weighted residual factors for significantly intense reflections: 0.104
• Weighted residual factors for all reflections included in the refinement: 0.1281
• Goodness-of-fit parameter for all reflections included in the refinement: 1.078
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: Yes