Information card for entry 2223644
| Chemical name |
Diethyl 3,4-bis(2,5-dimethoxybenzyl)thieno[2,3-<i>b</i>]thiophene-2,5-dicarboxylate |
| Formula |
C30 H32 O8 S2 |
| Calculated formula |
C30 H32 O8 S2 |
| SMILES |
c12c(c(c(C(=O)OCC)s2)Cc2cc(ccc2OC)OC)c(c(C(=O)OCC)s1)Cc1c(ccc(c1)OC)OC |
| Title of publication |
Diethyl 3,4-bis(2,5-dimethoxybenzyl)thieno[2,3-<i>b</i>]thiophene-2,5-dicarboxylate |
| Authors of publication |
Umadevi, M.; Sureshbabu, R.; Mohanakrishnan, A. K.; Chakkaravarthi, G.; Manivannan, V. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2009 |
| Journal volume |
65 |
| Journal issue |
11 |
| Pages of publication |
o2790 |
| a |
9.9439 ± 0.0003 Å |
| b |
10.8163 ± 0.0003 Å |
| c |
14.7536 ± 0.0005 Å |
| α |
82.61 ± 0.002° |
| β |
89.49 ± 0.002° |
| γ |
64.983 ± 0.001° |
| Cell volume |
1424.19 ± 0.08 Å3 |
| Cell temperature |
295 ± 2 K |
| Ambient diffraction temperature |
295 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0773 |
| Residual factor for significantly intense reflections |
0.0451 |
| Weighted residual factors for significantly intense reflections |
0.1118 |
| Weighted residual factors for all reflections included in the refinement |
0.13 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.015 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2223644.html