Information card for entry 2236232
| Chemical name |
(2-Aminoethanethiolato-κ^2^<i>N</i>,<i>S</i>)bis[1,2- bis(diphenylphosphanyl)ethane-κ^2^<i>P</i>,<i>P</i>']ruthenium(II) hexafluoridophosphate |
| Formula |
C54 H54 F6 N P5 Ru S |
| Calculated formula |
C54 H54 F6 N P5 Ru S |
| Title of publication |
(2-Aminoethanethiolato-κ^2^<i>N</i>,<i>S</i>)bis[1,2-bis(diphenylphosphanyl)ethane-κ^2^<i>P</i>,<i>P</i>']ruthenium(II) hexafluoridophosphate |
| Authors of publication |
Igashira-Kamiyama, Asako; Tamura, Motoshi; Konno, Takumi |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
11 |
| Pages of publication |
m1432 |
| a |
21.1985 ± 0.0017 Å |
| b |
11.4 ± 0.0009 Å |
| c |
20.9346 ± 0.0017 Å |
| α |
90° |
| β |
106.588 ± 0.002° |
| γ |
90° |
| Cell volume |
4848.6 ± 0.7 Å3 |
| Cell temperature |
200 ± 2 K |
| Ambient diffraction temperature |
200 ± 2 K |
| Number of distinct elements |
7 |
| Space group number |
9 |
| Hermann-Mauguin space group symbol |
C 1 c 1 |
| Hall space group symbol |
C -2yc |
| Residual factor for all reflections |
0.0689 |
| Residual factor for significantly intense reflections |
0.0438 |
| Weighted residual factors for significantly intense reflections |
0.0918 |
| Weighted residual factors for all reflections included in the refinement |
0.1124 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.204 |
| Diffraction radiation wavelength |
0.71075 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
Yes |
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https://www.crystallography.net/2236232.html