Information card for entry 2242239
| Common name |
CuTMPEN |
| Chemical name |
{<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-Tetrakis[(6-methylpyridin-2-yl)methyl]ethane-1,2-diamine-κ^6^<i>N</i>}copper(II) bis(tetrafluoridoborate) |
| Formula |
C30 H36 B2 Cu F8 N6 |
| Calculated formula |
C30 H36 B2 Cu F8 N6 |
| Title of publication |
Crystal structure of [Cu(tmpen)](BF~4~)~2~ {tmpen is <i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetrakis[(6-methylpyridin-2-yl)methyl]ethane-1,2-diamine} |
| Authors of publication |
Chen, Lin; Guo, Yakun; Ren, Gan; Sang, Ge |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2017 |
| Journal volume |
73 |
| Journal issue |
4 |
| Pages of publication |
640 - 643 |
| a |
18.67 ± 0.002 Å |
| b |
12.8309 ± 0.0015 Å |
| c |
14.0146 ± 0.0016 Å |
| α |
90° |
| β |
107.193 ± 0.002° |
| γ |
90° |
| Cell volume |
3207.2 ± 0.6 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0385 |
| Residual factor for significantly intense reflections |
0.0339 |
| Weighted residual factors for significantly intense reflections |
0.0933 |
| Weighted residual factors for all reflections included in the refinement |
0.0966 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.061 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2242239.html