Information card for entry 2242240
| Chemical name |
2-[(4-Chlorophenyl)selanyl]-3,4-dihydro-2<i>H</i>-benzo[<i>h</i>]chromene-5,6-dione |
| Formula |
C19 H13 Cl O3 Se |
| Calculated formula |
C19 H13 Cl O3 Se |
| SMILES |
[Se](C1OC2=C(C(=O)C(=O)c3c2cccc3)CC1)c1ccc(Cl)cc1 |
| Title of publication |
2-[(4-Chlorophenyl)selanyl]-3,4-dihydro-2<i>H</i>-benzo[<i>h</i>]chromene-5,6-dione: crystal structure and Hirshfeld analysis |
| Authors of publication |
Zukerman-Schpector, Julio; Prado, Karinne E.; Name, Luccas L.; Cella, Rodrigo; Jotani, Mukesh M.; Tiekink, Edward R. T. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2017 |
| Journal volume |
73 |
| Journal issue |
6 |
| Pages of publication |
918 - 924 |
| a |
7.3757 ± 0.0003 Å |
| b |
13.7306 ± 0.0005 Å |
| c |
16.4473 ± 0.0006 Å |
| α |
90° |
| β |
100.002 ± 0.001° |
| γ |
90° |
| Cell volume |
1640.35 ± 0.11 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0303 |
| Residual factor for significantly intense reflections |
0.0257 |
| Weighted residual factors for significantly intense reflections |
0.0658 |
| Weighted residual factors for all reflections included in the refinement |
0.0684 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.032 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2242240.html