Information card for entry 2243070
| Chemical name |
2-Methyl-1,1,2,3,3-pentaphenyl-2-silapropane |
| Formula |
C33 H30 Si |
| Calculated formula |
C33 H30 Si |
| SMILES |
[Si](C)(C(c1ccccc1)c1ccccc1)(C(c1ccccc1)c1ccccc1)c1ccccc1 |
| Title of publication |
Syntheses and crystal structures of 2-methyl-1,1,2,3,3-pentaphenyl-2-silapropane and 2-methyl-1,1,3,3-tetraphenyl-2-silapropan-2-ol |
| Authors of publication |
Williams, Alexandra; Brown, Michelle; Staples, Richard J.; Biros, Shannon M.; Winchester, William R. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2019 |
| Journal volume |
75 |
| Journal issue |
9 |
| Pages of publication |
1339 - 1343 |
| a |
10.3879 ± 0.0007 Å |
| b |
10.5037 ± 0.0007 Å |
| c |
13.635 ± 0.0009 Å |
| α |
68.8212 ± 0.0007° |
| β |
70.6364 ± 0.0007° |
| γ |
84.7947 ± 0.0008° |
| Cell volume |
1308.06 ± 0.15 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173.15 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0601 |
| Residual factor for significantly intense reflections |
0.0448 |
| Weighted residual factors for significantly intense reflections |
0.11 |
| Weighted residual factors for all reflections included in the refinement |
0.1204 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.076 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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