Information card for entry 2300766

Structure parameters

• Formula: F2 Xe
• Calculated formula: F2 Xe
• Title of publication: A simple cryotransfer method for 3D electron diffraction measurements of highly sensitive samples
• Authors of publication: Gurung, Kshitij; Uran, Erik; Motaln, Klemen; Brázda, Petr; Radan, Kristian; Lozinšek, Matic; Palatinus, Lukáš
• Journal of publication: Journal of Applied Crystallography
• Year of publication: 2025
• Journal volume: 58
• Journal issue: 3
• Pages of publication: 1079 - 1084
• a: 4.2249 ± 0.001 Å
• b: 4.2249 ± 0.001 Å
• c: 6.9526 ± 0.0018 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 124.1 ± 0.05 ų
• Cell temperature: 100 K
• Ambient diffraction temperature: 100 K
• Number of distinct elements: 2
• Space group number: 139
• Hermann-Mauguin space group symbol: I 4/m m m
• Hall space group symbol: -I 4 2
• Residual factor for all reflections: 0.123
• Residual factor for significantly intense reflections: 0.123
• Weighted residual factors for significantly intense reflections: 0.1585
• Weighted residual factors for all reflections included in the refinement: 0.1585
• Goodness-of-fit parameter for significantly intense reflections: 3.435
• Goodness-of-fit parameter for all reflections included in the refinement: 3.435
• Diffraction radiation probe: electron
• Diffraction radiation wavelength: 0.0251 Å
• Diffraction radiation type: electrons200keV
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No