Information card for entry 2300767

Structure parameters

• Formula: F4 Xe
• Calculated formula: F4 Xe
• Title of publication: A simple cryotransfer method for 3D electron diffraction measurements of highly sensitive samples
• Authors of publication: Gurung, Kshitij; Uran, Erik; Motaln, Klemen; Brázda, Petr; Radan, Kristian; Lozinšek, Matic; Palatinus, Lukáš
• Journal of publication: Journal of Applied Crystallography
• Year of publication: 2025
• Journal volume: 58
• Journal issue: 3
• Pages of publication: 1079 - 1084
• a: 5.0148 ± 0.0008 Å
• b: 5.7392 ± 0.0015 Å
• c: 5.9043 ± 0.0014 Å
• α: 90°
• β: 100.866 ± 0.015°
• γ: 90°
• Cell volume: 166.88 ± 0.07 ų
• Cell temperature: 100 K
• Ambient diffraction temperature: 100 K
• Number of distinct elements: 2
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.1341
• Residual factor for significantly intense reflections: 0.1073
• Weighted residual factors for significantly intense reflections: 0.1196
• Weighted residual factors for all reflections included in the refinement: 0.1221
• Goodness-of-fit parameter for significantly intense reflections: 0
• Goodness-of-fit parameter for all reflections included in the refinement: 2.5236
• Diffraction radiation probe: electron
• Diffraction radiation wavelength: 0.0251 Å
• Diffraction radiation type: electrons200keV
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No