Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4001715
Preview
| Coordinates | 4001715.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H51 N2 S4 Sn |
|---|---|
| Calculated formula | C26 H54 N2 S4 Sn |
| SMILES | [Sn]1(SC(=S)N(CCCC)CCCC)(SC(=[S]1)N(CCCC)CCCC)(CCCC)CCCC |
| Title of publication | Organotin Dithiocarbamates: Single-Source Precursors for Tin Sulfide Thin Films by Aerosol-Assisted Chemical Vapor Deposition (AACVD) |
| Authors of publication | Ramasamy, Karthik; Kuznetsov, Vladimir L.; Gopal, Kandasamy; Malik, Mohammad A.; Raftery, James; Edwards, Peter P.; O'Brien, Paul |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2013 |
| Journal volume | 25 |
| Journal issue | 3 |
| Pages of publication | 266 - 276 |
| a | 20.345 ± 0.005 Å |
| b | 9.597 ± 0.005 Å |
| c | 34.35 ± 0.005 Å |
| α | 90 ± 0.005° |
| β | 91.27 ± 0.005° |
| γ | 90 ± 0.005° |
| Cell volume | 6705 ± 4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0482 |
| Residual factor for significantly intense reflections | 0.0318 |
| Weighted residual factors for significantly intense reflections | 0.0755 |
| Weighted residual factors for all reflections included in the refinement | 0.0927 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4001715.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.