Information card for entry 4001954
| Common name |
11008a |
| Formula |
C48 H34 F6 |
| Calculated formula |
C48 H34 F6 |
| SMILES |
Cc1cc(C)cc(c1)c1c2c(c3ccc(cc3)C(F)(F)F)c3ccccc3c(c2c(c2c1cccc2)c1cc(C)cc(c1)C)c1ccc(cc1)C(F)(F)F |
| Title of publication |
Rubrene-Based Single-Crystal Organic Semiconductors: Synthesis, Electronic Structure, and Charge-Transport Properties |
| Authors of publication |
McGarry, Kathryn A.; Xie, Wei; Sutton, Christopher; Risko, Chad; Wu, Yanfei; Young, Victor G.; Brédas, Jean-Luc; Frisbie, C. Daniel; Douglas, Christopher J. |
| Journal of publication |
Chemistry of Materials |
| Year of publication |
2013 |
| Journal volume |
25 |
| Journal issue |
11 |
| Pages of publication |
2254 |
| a |
7.5317 ± 0.001 Å |
| b |
14.634 ± 0.002 Å |
| c |
32.424 ± 0.004 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
3573.7 ± 0.8 Å3 |
| Cell temperature |
123 ± 2 K |
| Ambient diffraction temperature |
123 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
57 |
| Hermann-Mauguin space group symbol |
P b c m |
| Hall space group symbol |
-P 2c 2b |
| Residual factor for all reflections |
0.0976 |
| Residual factor for significantly intense reflections |
0.0761 |
| Weighted residual factors for significantly intense reflections |
0.2043 |
| Weighted residual factors for all reflections included in the refinement |
0.2221 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.057 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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