Information card for entry 4002204
| Formula |
C25 H22 S2 |
| Calculated formula |
C25 H22 S2 |
| SMILES |
s1c2c3ccc(cc3sc2c2ccc(cc12)c1ccccc1)CCCCC |
| Title of publication |
Effects of Substituted Alkyl Chain Length on Solution-Processable Layered Organic Semiconductor Crystals |
| Authors of publication |
Inoue, Satoru; Minemawari, Hiromi; Tsutsumi, Jun’ya; Chikamatsu, Masayuki; Yamada, Toshikazu; Horiuchi, Sachio; Tanaka, Mutsuo; Kumai, Reiji; Yoneya, Makoto; Hasegawa, Tatsuo |
| Journal of publication |
Chemistry of Materials |
| Year of publication |
2015 |
| Journal volume |
27 |
| Journal issue |
11 |
| Pages of publication |
3809 |
| a |
6.0866 ± 0.0001 Å |
| b |
7.8111 ± 0.0001 Å |
| c |
42.5972 ± 0.0007 Å |
| α |
90° |
| β |
91.8394 ± 0.0007° |
| γ |
90° |
| Cell volume |
2024.16 ± 0.05 Å3 |
| Cell temperature |
300 K |
| Ambient diffraction temperature |
300 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/a 1 |
| Hall space group symbol |
-P 2yab |
| Residual factor for all reflections |
0.1132 |
| Residual factor for significantly intense reflections |
0.0691 |
| Weighted residual factors for significantly intense reflections |
0.1837 |
| Weighted residual factors for all reflections included in the refinement |
0.2272 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.016 |
| Diffraction radiation wavelength |
1.54187 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/4002204.html