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Information card for entry 4034090
Preview
| Coordinates | 4034090.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Cp*RhCl(4-CF3PhPy) |
|---|---|
| Formula | C22 H22 Cl F3 N Rh |
| Calculated formula | C22 H22 Cl F3 N Rh |
| SMILES | [Rh]12345(Cl)([n]6c(c7c1cc(cc7)C(F)(F)F)cccc6)[c]1([c]2([c]3([c]4([c]51C)C)C)C)C |
| Title of publication | Reversible Concerted Metalation-Deprotonation C-H Bond Activation by [Cp*RhCl<sub>2</sub>]<sub>2</sub>. |
| Authors of publication | VanderWeide, Andrew I.; Brennessel, William W.; Jones, William D. |
| Journal of publication | The Journal of organic chemistry |
| Year of publication | 2019 |
| Journal volume | 84 |
| Journal issue | 20 |
| Pages of publication | 12960 - 12965 |
| a | 15.4508 ± 0.0001 Å |
| b | 7.7143 ± 0.0001 Å |
| c | 16.5076 ± 0.0001 Å |
| α | 90° |
| β | 92.558 ± 0.001° |
| γ | 90° |
| Cell volume | 1965.62 ± 0.03 Å3 |
| Cell temperature | 100.01 ± 0.1 K |
| Ambient diffraction temperature | 100.01 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.027 |
| Residual factor for significantly intense reflections | 0.0266 |
| Weighted residual factors for significantly intense reflections | 0.0685 |
| Weighted residual factors for all reflections included in the refinement | 0.0689 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.096 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4034090.html
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Users of the data should acknowledge the original authors of the
structural data.