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Information card for entry 4034091
Preview
| Coordinates | 4034091.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Cp*RhCl(4-ClPhPy) |
|---|---|
| Formula | C21 H22 Cl2 N Rh |
| Calculated formula | C21 H22 Cl2 N Rh |
| SMILES | [Rh]12345(Cl)(c6cc(ccc6c6cccc[n]16)Cl)[c]1([c]2([c]3([c]4([c]51C)C)C)C)C |
| Title of publication | Reversible Concerted Metalation-Deprotonation C-H Bond Activation by [Cp*RhCl<sub>2</sub>]<sub>2</sub>. |
| Authors of publication | VanderWeide, Andrew I.; Brennessel, William W.; Jones, William D. |
| Journal of publication | The Journal of organic chemistry |
| Year of publication | 2019 |
| Journal volume | 84 |
| Journal issue | 20 |
| Pages of publication | 12960 - 12965 |
| a | 7.3494 ± 0.0002 Å |
| b | 15.8182 ± 0.0003 Å |
| c | 15.8765 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1845.71 ± 0.07 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0492 |
| Residual factor for significantly intense reflections | 0.0466 |
| Weighted residual factors for significantly intense reflections | 0.134 |
| Weighted residual factors for all reflections included in the refinement | 0.1368 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.085 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4034091.html
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Users of the data should acknowledge the original authors of the
structural data.