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Information card for entry 4067855
Preview
| Coordinates | 4067855.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H62 O P2 S2 Si4 Sn |
|---|---|
| Calculated formula | C32 H62 O P2 S2 Si4 Sn |
| SMILES | [Sn]12(P(C([Si](C)(C)C)[Si](C)(C)C)c3ccccc3[S]1C)P(C([Si](C)(C)C)[Si](C)(C)C)c1ccccc1[S]2C.O(CC)CC |
| Title of publication | Hypervalent Sulfur-Functionalized Diphosphagermylene and Diphosphastannylene Compounds |
| Authors of publication | Izod, Keith; Clark, Ewan R.; Clegg, William; Harrington, Ross W. |
| Journal of publication | Organometallics |
| Year of publication | 2012 |
| Journal volume | 31 |
| Journal issue | 1 |
| Pages of publication | 246 |
| a | 16.9798 ± 0.0015 Å |
| b | 11.0771 ± 0.001 Å |
| c | 23.0424 ± 0.0018 Å |
| α | 90° |
| β | 99.466 ± 0.008° |
| γ | 90° |
| Cell volume | 4275 ± 0.6 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1001 |
| Residual factor for significantly intense reflections | 0.0596 |
| Weighted residual factors for significantly intense reflections | 0.1594 |
| Weighted residual factors for all reflections included in the refinement | 0.1694 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.997 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4067855.html
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