Information card for entry 4074208

Structure parameters

• Common name: DMAD_adduct
• Formula: C72 H124 O4 Si7 Sn Te
• Calculated formula: C72 H124 O4 Si7 Sn Te
• SMILES: [Sn]1([Te]C(=C1C(=O)OC)C(=O)OC)(c1c(cc(cc1C([Si](C)(C)C)[Si](C)(C)C)C([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)C([Si](C)(C)C)[Si](C)(C)C)c1c(cccc1c1ccc(cc1C(C)C)C(C)C)c1ccc(cc1C(C)C)C(C)C.CCCCCC
• Title of publication: A Kinetically Stabilized Stannanetellone, a Tin−Tellurium Double-Bonded Compound
• Authors of publication: Tajima, Tomoyuki; Takeda, Nobuhiro; Sasamori, Takahiro; Tokitoh, Norihiro
• Journal of publication: Organometallics
• Year of publication: 2006
• Journal volume: 25
• Journal issue: 15
• Pages of publication: 3552
• a: 14.7865 ± 0.0003 Å
• b: 12.0183 ± 0.0002 Å
• c: 45.0513 ± 0.001 Å
• α: 90°
• β: 96.6821 ± 0.0007°
• γ: 90°
• Cell volume: 7951.6 ± 0.3 ų
• Cell temperature: 103 ± 2 K
• Ambient diffraction temperature: 103 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0807
• Residual factor for significantly intense reflections: 0.0396
• Weighted residual factors for significantly intense reflections: 0.06
• Weighted residual factors for all reflections included in the refinement: 0.0673
• Goodness-of-fit parameter for all reflections included in the refinement: 1.011
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No