Information card for entry 4077356

Structure parameters

• Formula: C64 H62 B2 F8 N4 P2 Pt2
• Calculated formula: C64 H62 B2 F8 N4 P2 Pt2
• SMILES: [Pt]1([P](c2ccccc2)(c2ccccc2)c2ccccc2)([N](Cc2c1cccc2)(C)C)[n]1ccc(cc1)c1cc[n]([Pt]2([P](c3ccccc3)(c3ccccc3)c3ccccc3)[N](Cc3c2cccc3)(C)C)cc1.[B](F)(F)(F)[F-].[B](F)(F)(F)[F-]
• Title of publication: C,N-2-[(Dimethylamino)methyl]phenylplatinum Complexes Functionalized with C60as Macromolecular Building Blocks
• Authors of publication: Meijer, Michel D.; de Wolf, Elwin; Lutz, Martin; Spek, Anthony L.; van Klink, Gerard P. M.; van Koten, Gerard
• Journal of publication: Organometallics
• Year of publication: 2001
• Journal volume: 20
• Journal issue: 20
• Pages of publication: 4198
• a: 9.5341 ± 0.0001 Å
• b: 18.7097 ± 0.0002 Å
• c: 22.0895 ± 0.0003 Å
• α: 110.188 ± 0.0005°
• β: 98.5576 ± 0.0004°
• γ: 100.552 ± 0.0007°
• Cell volume: 3538.44 ± 0.07 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0576
• Residual factor for significantly intense reflections: 0.0359
• Weighted residual factors for significantly intense reflections: 0.0745
• Weighted residual factors for all reflections included in the refinement: 0.0785
• Goodness-of-fit parameter for all reflections included in the refinement: 1.002
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No