Information card for entry 4079491

Structure parameters

• Formula: C36 H44 N2 O2 Si2 W
• Calculated formula: C36 H44 N2 O2 Si2 W
• SMILES: [W](=C=C([Si]([n+]1ccc(N(C)C)cc1)(c1ccccc1)c1ccccc1)[Si](C)(C)C)(C#[O])(C#[O])[c]1([c]([c]([c]([c]1C)C)C)C)C
• Title of publication: Reactions of Tungsten Acetylide‒Silylene Complexes with Pyridines: Direct Observation of Silylene/Silyl Migration in Tungsten Acetylide and Carbyne/Vinylidene Frameworks
• Authors of publication: Sakaba, Hiroyuki; Oike, Hiroyuki; Arai, Yasuhiro; Kwon, Eunsang
• Journal of publication: Organometallics
• Year of publication: 2012
• Journal volume: 31
• Journal issue: 23
• Pages of publication: 8172
• a: 9.675 ± 0.003 Å
• b: 11.977 ± 0.004 Å
• c: 15.321 ± 0.005 Å
• α: 92.19 ± 0.006°
• β: 95.119 ± 0.004°
• γ: 91.953 ± 0.005°
• Cell volume: 1765.7 ± 1 ų
• Cell temperature: 173 K
• Ambient diffraction temperature: 173 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for significantly intense reflections: 0.0237
• Weighted residual factors for all reflections included in the refinement: 0.0672
• Goodness-of-fit parameter for all reflections included in the refinement: 1.005
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No