Information card for entry 4079893
| Common name |
ClPhSi(ON[Me]O) |
| Chemical name |
2,4,8,10-tetra-tert-butyl-6-chloro-12-methyl-6-phenyl-12H- dibenzo[d,g][1,3,6,2]dioxazasilocine |
| Formula |
C35 H48 Cl N O2 Si |
| Calculated formula |
C35 H48 Cl N O2 Si |
| SMILES |
[Si]1(Cl)(Oc2c(N(C)c3c(O1)c(cc(c3)C(C)(C)C)C(C)(C)C)cc(cc2C(C)(C)C)C(C)(C)C)c1ccccc1 |
| Title of publication |
Migrations of Alkyl and Aryl Groups from Silicon to Nitrogen in Silylated Aryloxyiminoquinones |
| Authors of publication |
Shekar, Sukesh; Brown, Seth N. |
| Journal of publication |
Organometallics |
| Year of publication |
2013 |
| Journal volume |
32 |
| Journal issue |
2 |
| Pages of publication |
556 |
| a |
10.7842 ± 0.001 Å |
| b |
10.7966 ± 0.0009 Å |
| c |
14.8554 ± 0.0013 Å |
| α |
74.145 ± 0.002° |
| β |
79.789 ± 0.002° |
| γ |
76.926 ± 0.002° |
| Cell volume |
1608.4 ± 0.2 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0737 |
| Residual factor for significantly intense reflections |
0.0439 |
| Weighted residual factors for significantly intense reflections |
0.0957 |
| Weighted residual factors for all reflections included in the refinement |
0.1088 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.016 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4079893.html