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Information card for entry 4084118
Preview
| Coordinates | 4084118.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H56 N2 P2 Tm |
|---|---|
| Calculated formula | C38 H56 N2 P2 Tm |
| SMILES | [Tm]123456789(P%10[C]2(=[C]3([C]4(=[C]5%10C(C)(C)C)C)C)C(C)(C)C)(P2[C]9(=[C]8([C]7(=[C]62C(C)(C)C)C)C)C(C)(C)C)[n]2ccccc2c2[n]1cccc2 |
| Title of publication | Multiple One-Electron Transfers in Bipyridine Complexes of Bis(phospholyl) Thulium |
| Authors of publication | Jacquot, Léa; Xémard, Mathieu; Clavaguéra, Carine; Nocton, Grégory |
| Journal of publication | Organometallics |
| Year of publication | 2014 |
| Journal volume | 33 |
| Journal issue | 15 |
| Pages of publication | 4100 |
| a | 10.669 ± 0.001 Å |
| b | 16.178 ± 0.001 Å |
| c | 21.32 ± 0.001 Å |
| α | 90° |
| β | 101.734 ± 0.001° |
| γ | 90° |
| Cell volume | 3603 ± 0.4 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0388 |
| Residual factor for significantly intense reflections | 0.0346 |
| Weighted residual factors for significantly intense reflections | 0.132 |
| Weighted residual factors for all reflections included in the refinement | 0.1406 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4084118.html
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Users of the data should acknowledge the original authors of the
structural data.