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Information card for entry 4084119
Preview
| Coordinates | 4084119.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C41 H48 N4 P Tm |
|---|---|
| Calculated formula | C41 H48 N4 P Tm |
| SMILES | [C]12(=[C]3([C]4(=[C]5(P2[Tm]261345([n]1ccccc1c1[n]2cccc1)[n]1c(c2[n]6cccc2)cccc1)C(C)(C)C)C)C)C(C)(C)C.c1(ccccc1)C |
| Title of publication | Multiple One-Electron Transfers in Bipyridine Complexes of Bis(phospholyl) Thulium |
| Authors of publication | Jacquot, Léa; Xémard, Mathieu; Clavaguéra, Carine; Nocton, Grégory |
| Journal of publication | Organometallics |
| Year of publication | 2014 |
| Journal volume | 33 |
| Journal issue | 15 |
| Pages of publication | 4100 |
| a | 10.7289 ± 0.0003 Å |
| b | 19.5591 ± 0.0004 Å |
| c | 17.042 ± 0.0005 Å |
| α | 90° |
| β | 92.742 ± 0.001° |
| γ | 90° |
| Cell volume | 3572.13 ± 0.16 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/a 1 |
| Hall space group symbol | -P 2yab |
| Residual factor for all reflections | 0.0758 |
| Residual factor for significantly intense reflections | 0.0471 |
| Weighted residual factors for significantly intense reflections | 0.0876 |
| Weighted residual factors for all reflections included in the refinement | 0.1027 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.075 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4084119.html
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Users of the data should acknowledge the original authors of the
structural data.