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Information card for entry 4085430
Preview
| Coordinates | 4085430.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C99 H139 K3 N6 Si3 |
|---|---|
| Calculated formula | C99 H139 K3 N6 Si3 |
| Title of publication | Group 1 Complexes of an (Amido-amino)silane and Their Use in the Synthesis of the Bi(III) Amide, Bi(Me2Si{NAr}{N(H)Ar})Cl2(Ar = 2,6-i-Pr2C6H3) |
| Authors of publication | Schwamm, Ryan J.; Coles, Martyn P.; Fitchett, Christopher M. |
| Journal of publication | Organometallics |
| Year of publication | 2015 |
| Journal volume | 34 |
| Journal issue | 11 |
| Pages of publication | 2500 |
| a | 16.6239 ± 0.0003 Å |
| b | 17.1021 ± 0.0004 Å |
| c | 17.7075 ± 0.0004 Å |
| α | 84.9008 ± 0.0019° |
| β | 83.8507 ± 0.0018° |
| γ | 76.4098 ± 0.0019° |
| Cell volume | 4854.61 ± 0.19 Å3 |
| Cell temperature | 120.01 ± 0.1 K |
| Ambient diffraction temperature | 120.01 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0761 |
| Residual factor for significantly intense reflections | 0.0666 |
| Weighted residual factors for significantly intense reflections | 0.1844 |
| Weighted residual factors for all reflections included in the refinement | 0.195 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4085430.html
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