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Information card for entry 4085431
Preview
| Coordinates | 4085431.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H41 Bi Cl2 N2 Si |
|---|---|
| Calculated formula | C26 H41 Bi Cl2 N2 Si |
| SMILES | [Bi]1(Cl)(Cl)N(c2c(cccc2C(C)C)C(C)C)[Si]([NH]1c1c(cccc1C(C)C)C(C)C)(C)C |
| Title of publication | Group 1 Complexes of an (Amido-amino)silane and Their Use in the Synthesis of the Bi(III) Amide, Bi(Me2Si{NAr}{N(H)Ar})Cl2(Ar = 2,6-i-Pr2C6H3) |
| Authors of publication | Schwamm, Ryan J.; Coles, Martyn P.; Fitchett, Christopher M. |
| Journal of publication | Organometallics |
| Year of publication | 2015 |
| Journal volume | 34 |
| Journal issue | 11 |
| Pages of publication | 2500 |
| a | 9.2487 ± 0.0003 Å |
| b | 10.3251 ± 0.0003 Å |
| c | 15.3742 ± 0.0004 Å |
| α | 84.291 ± 0.002° |
| β | 82.523 ± 0.002° |
| γ | 88.256 ± 0.002° |
| Cell volume | 1448.21 ± 0.07 Å3 |
| Cell temperature | 278.87 ± 0.1 K |
| Ambient diffraction temperature | 278.87 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0303 |
| Residual factor for significantly intense reflections | 0.0282 |
| Weighted residual factors for significantly intense reflections | 0.0646 |
| Weighted residual factors for all reflections included in the refinement | 0.066 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4085431.html
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Users of the data should acknowledge the original authors of the
structural data.