Information card for entry 4085728
| Formula |
C28 H30 Cl2 N O4 P Si |
| Calculated formula |
C28 H30 Cl2 N O4 P Si |
| SMILES |
P1(=[N]([Si](Cl)(Cl)(C(=C1C(=O)OC)C(=O)OC)C)c1c(cc(cc1C)C)C)(c1ccccc1)c1ccccc1 |
| Title of publication |
Fine Tuning of the Substituents on the N-Geminal Phosphorus/Silicon-Based Lewis Pairs for the Synthesis ofZ-Type Silyliminophosphoranylalkenes |
| Authors of publication |
Li, Jiancheng; Li, Yan; Purushothaman, Indu; De, Susmita; Li, Bin; Zhu, Hongping; Parameswaran, Pattiyil; Ye, Qingsong; Liu, Weiping |
| Journal of publication |
Organometallics |
| Year of publication |
2015 |
| Journal volume |
34 |
| Journal issue |
17 |
| Pages of publication |
4209 |
| a |
12.5102 ± 0.0005 Å |
| b |
12.9857 ± 0.0005 Å |
| c |
17.7713 ± 0.0007 Å |
| α |
90° |
| β |
101.348 ± 0.004° |
| γ |
90° |
| Cell volume |
2830.6 ± 0.2 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
7 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0602 |
| Residual factor for significantly intense reflections |
0.0454 |
| Weighted residual factors for significantly intense reflections |
0.1012 |
| Weighted residual factors for all reflections included in the refinement |
0.1084 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.045 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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