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Information card for entry 4100876
Preview
| Coordinates | 4100876.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [HBPTSMe][OTf] |
|---|---|
| Formula | C7 H4 F3 N3 O3 S3 Se2 |
| Calculated formula | C7 H4 F3 N3 O3 S3 Se2 |
| Title of publication | Pressure enhanced conductivity in bis-1,2,3-thiaselenazolyl dimers |
| Authors of publication | Beer, Leanne; Brusso, Jaclyn L.; Haddon, Robert C.; Itkis, Mikhail E.; Kleinke, Holger; Leitch, Alicea A.; Oakley, Richard T.; Reed, Robert W.; Richardson, John F.; Secco, Richard A.; Yu, Xueyang |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2005 |
| Journal volume | 127 |
| Journal issue | 51 |
| Pages of publication | 18159 - 18170 |
| a | 7.227 ± 0.002 Å |
| b | 8.653 ± 0.002 Å |
| c | 12.729 ± 0.003 Å |
| α | 102.354 ± 0.004° |
| β | 98.757 ± 0.004° |
| γ | 110.608 ± 0.004° |
| Cell volume | 704.9 ± 0.3 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0433 |
| Residual factor for significantly intense reflections | 0.0317 |
| Weighted residual factors for significantly intense reflections | 0.0757 |
| Weighted residual factors for all reflections included in the refinement | 0.0794 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.002 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4100876.html
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Users of the data should acknowledge the original authors of the
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