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Information card for entry 4100877
Preview
| Coordinates | 4100877.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [HBPTSMe] |
|---|---|
| Formula | C12 H8 N6 S4 Se4 |
| Calculated formula | C12 H8 N6 S4 Se4 |
| SMILES | C12C(=N[Se]S2)N(/C(=N/[Se][Se]/N=C2\C(=S)C=C3C(=N[Se]S3)N2C)C(=S)C=1)C |
| Title of publication | Pressure enhanced conductivity in bis-1,2,3-thiaselenazolyl dimers |
| Authors of publication | Beer, Leanne; Brusso, Jaclyn L.; Haddon, Robert C.; Itkis, Mikhail E.; Kleinke, Holger; Leitch, Alicea A.; Oakley, Richard T.; Reed, Robert W.; Richardson, John F.; Secco, Richard A.; Yu, Xueyang |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2005 |
| Journal volume | 127 |
| Journal issue | 51 |
| Pages of publication | 18159 - 18170 |
| a | 4.924 ± 0.004 Å |
| b | 12.616 ± 0.011 Å |
| c | 15.086 ± 0.013 Å |
| α | 90° |
| β | 94.563 ± 0.014° |
| γ | 90° |
| Cell volume | 934.1 ± 1.4 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0773 |
| Residual factor for significantly intense reflections | 0.0439 |
| Weighted residual factors for significantly intense reflections | 0.0939 |
| Weighted residual factors for all reflections included in the refinement | 0.1051 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.011 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.