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Information card for entry 4103201
Preview
| Coordinates | 4103201.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [SiP(Ph)3]Pt-CH3 |
|---|---|
| Formula | C63 H61 O2 P3 Pt Si |
| Calculated formula | C63 H61 O2 P3 Pt Si |
| SMILES | [Pt]123(C)[Si](c4c([P]1(c1ccccc1)c1ccccc1)cccc4)(c1c([P]2(c2ccccc2)c2ccccc2)cccc1)c1c([P]3(c2ccccc2)c2ccccc2)cccc1.O1CCCC1.O1CCCC1 |
| Title of publication | Four-Coordinate, trigonal Pyramidal Pt(II) and Pd(II) Complexes |
| Authors of publication | Charlene Tsay; Neal P. Mankad; Jonas C. Peters |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2010 |
| Journal volume | 132 |
| Pages of publication | 13975 - 13977 |
| a | 18.745 ± 0.002 Å |
| b | 16.1454 ± 0.0018 Å |
| c | 16.911 ± 0.002 Å |
| α | 90° |
| β | 94.181 ± 0.004° |
| γ | 90° |
| Cell volume | 5104.4 ± 1 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0844 |
| Residual factor for significantly intense reflections | 0.0506 |
| Weighted residual factors for significantly intense reflections | 0.1189 |
| Weighted residual factors for all reflections included in the refinement | 0.1457 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.091 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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