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Information card for entry 4103202
Preview
| Coordinates | 4103202.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [SiP(Ph)3]Pt-Cl |
|---|---|
| Formula | C55 H44 Cl3 P3 Pt Si |
| Calculated formula | C55 H44 Cl3 P3 Pt Si |
| SMILES | [Pt]123(Cl)[Si](c4c([P]1(c1ccccc1)c1ccccc1)cccc4)(c1c([P]2(c2ccccc2)c2ccccc2)cccc1)c1c([P]3(c2ccccc2)c2ccccc2)cccc1.C(Cl)Cl |
| Title of publication | Four-Coordinate, trigonal Pyramidal Pt(II) and Pd(II) Complexes |
| Authors of publication | Charlene Tsay; Neal P. Mankad; Jonas C. Peters |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2010 |
| Journal volume | 132 |
| Pages of publication | 13975 - 13977 |
| a | 11.1768 ± 0.0012 Å |
| b | 13.3695 ± 0.0014 Å |
| c | 15.7387 ± 0.0016 Å |
| α | 87.699 ± 0.002° |
| β | 84.961 ± 0.002° |
| γ | 86.359 ± 0.002° |
| Cell volume | 2336.6 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0489 |
| Residual factor for significantly intense reflections | 0.0422 |
| Weighted residual factors for significantly intense reflections | 0.104 |
| Weighted residual factors for all reflections included in the refinement | 0.1081 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.082 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4103202.html
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