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Information card for entry 4113977
Preview
| Coordinates | 4113977.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H45 P3 Ru Si2 |
|---|---|
| Calculated formula | C15 H45 P3 Ru Si2 |
| SMILES | [RuH]1([P](C)(C)C)([P](C)(C)C)([P](C)(C)C)[H][Si](C)(C)CC[Si]1(C)C |
| Title of publication | Structure and Reactivity of Bis(silyl) Dihydride Complexes (PMe3)3Ru(SiR3)2(H)2: Model Compounds and Real Intermediates in a Dehydrogenative C-Si Bond Forming Reaction |
| Authors of publication | Vladimir K. Dioumaev; Bok R. Yoo; Leo J. Procopio; Patrick J. Carroll; Donald H. Berry |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2003 |
| Journal volume | 125 |
| Pages of publication | 8936 - 8948 |
| a | 35.9187 ± 0.0005 Å |
| b | 9.321 ± 0.0001 Å |
| c | 16.1099 ± 0.0001 Å |
| α | 90° |
| β | 114.123 ± 0.001° |
| γ | 90° |
| Cell volume | 4922.55 ± 0.1 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0507 |
| Residual factor for significantly intense reflections | 0.0445 |
| Weighted residual factors for all reflections | 0.1107 |
| Weighted residual factors for significantly intense reflections | 0.1065 |
| Goodness-of-fit parameter for all reflections | 1.103 |
| Goodness-of-fit parameter for significantly intense reflections | 1.113 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4113977.html
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