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Information card for entry 4127551
Preview
| Coordinates | 4127551.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H79 B Co N2 O P3 Si |
|---|---|
| Calculated formula | C44 H79 B Co N2 O P3 Si |
| SMILES | [CoH2]12([P](C(C)C)(C(C)C)C[B](c3ccccc3)(C[P]1(C(C)C)C(C)C)C[P]2(C(C)C)C(C)C)[SiH]([n+]1ccc(N(C)C)cc1)c1ccccc1.O1CCCC1 |
| Title of publication | Activations of all Bonds to Silicon (Si-H, Si-C) in a Silane with Extrusion of [CoSiCo] Silicide Cores. |
| Authors of publication | Handford, Rex C.; Smith, Patrick W.; Tilley, T. Don |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 22 |
| Pages of publication | 8769 - 8772 |
| a | 21.403 ± 0.001 Å |
| b | 10.1831 ± 0.0005 Å |
| c | 21.2625 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4634.1 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100.15 K |
| Number of distinct elements | 8 |
| Space group number | 29 |
| Hermann-Mauguin space group symbol | P c a 21 |
| Hall space group symbol | P 2c -2ac |
| Residual factor for all reflections | 0.0327 |
| Residual factor for significantly intense reflections | 0.0289 |
| Weighted residual factors for significantly intense reflections | 0.0709 |
| Weighted residual factors for all reflections included in the refinement | 0.0797 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.119 |
| Diffraction radiation wavelength | 0.7288 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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