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Information card for entry 4127550
Preview
| Coordinates | 4127550.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | [[BP2iPr](PhSiH2)CoH2]Si[H2Co[BP3iPr]] |
|---|---|
| Formula | C53 H101 B2 Co2 P5 Si2 |
| Calculated formula | C53 H101 B2 Co2 P5 Si2 |
| Title of publication | Activations of all Bonds to Silicon (Si-H, Si-C) in a Silane with Extrusion of [CoSiCo] Silicide Cores. |
| Authors of publication | Handford, Rex C.; Smith, Patrick W.; Tilley, T. Don |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 22 |
| Pages of publication | 8769 - 8772 |
| a | 11.5244 ± 0.0004 Å |
| b | 12.7658 ± 0.0004 Å |
| c | 21.215 ± 0.0007 Å |
| α | 95.296 ± 0.001° |
| β | 96.883 ± 0.001° |
| γ | 107.287 ± 0.001° |
| Cell volume | 2931.59 ± 0.17 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0749 |
| Residual factor for significantly intense reflections | 0.0504 |
| Weighted residual factors for significantly intense reflections | 0.105 |
| Weighted residual factors for all reflections included in the refinement | 0.1152 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.7288 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4127550.html
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