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Information card for entry 4130025
Preview
| Coordinates | 4130025.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H45 Br N4 Ni |
|---|---|
| Calculated formula | C44 H45 Br N4 Ni |
| SMILES | Br[Ni]12=C3N(c4ccccc4N3c3c(cccc3C(C)C)C(C)C)c3cccc(N4C=1N(c1ccccc41)c1c(cccc1C(C)C)C(C)C)c23 |
| Title of publication | Accessing Pincer Bis(carbene) Ni(IV) Complexes from Ni(II) via Halogen and Halogen Surrogates. |
| Authors of publication | Martinez, Gabriel Espinosa; Ocampo, Cristian; Park, Yun Ji; Fout, Alison R. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 13 |
| Pages of publication | 4290 - 4293 |
| a | 8.6747 ± 0.0004 Å |
| b | 13.9513 ± 0.0007 Å |
| c | 16.8043 ± 0.0008 Å |
| α | 111.461 ± 0.0018° |
| β | 101.546 ± 0.002° |
| γ | 97.071 ± 0.002° |
| Cell volume | 1810.91 ± 0.15 Å3 |
| Cell temperature | 99.99 K |
| Ambient diffraction temperature | 99.99 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.037 |
| Residual factor for significantly intense reflections | 0.0299 |
| Weighted residual factors for significantly intense reflections | 0.0689 |
| Weighted residual factors for all reflections included in the refinement | 0.0725 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.098 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4130025.html
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Users of the data should acknowledge the original authors of the
structural data.