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Information card for entry 4130026
Preview
| Coordinates | 4130026.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H45 Br3 N4 Ni |
|---|---|
| Calculated formula | C44 H45 Br3 N4 Ni |
| SMILES | Br[Ni]12(Br)(Br)=C3N(c4ccccc4N3c3cccc(N4c5ccccc5N(C=24)c2c(cccc2C(C)C)C(C)C)c13)c1c(cccc1C(C)C)C(C)C |
| Title of publication | Accessing Pincer Bis(carbene) Ni(IV) Complexes from Ni(II) via Halogen and Halogen Surrogates. |
| Authors of publication | Martinez, Gabriel Espinosa; Ocampo, Cristian; Park, Yun Ji; Fout, Alison R. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 13 |
| Pages of publication | 4290 - 4293 |
| a | 13.3193 ± 0.0016 Å |
| b | 18.921 ± 0.002 Å |
| c | 15.612 ± 0.0019 Å |
| α | 90° |
| β | 90.851 ± 0.006° |
| γ | 90° |
| Cell volume | 3934 ± 0.8 Å3 |
| Cell temperature | 100.15 K |
| Ambient diffraction temperature | 100.15 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0249 |
| Residual factor for significantly intense reflections | 0.02 |
| Weighted residual factors for significantly intense reflections | 0.0509 |
| Weighted residual factors for all reflections included in the refinement | 0.0524 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.062 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4130026.html
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