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Information card for entry 4130662
Preview
| Coordinates | 4130662.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C86 H114 Cl8 S12 Si12 |
|---|---|
| Calculated formula | C86 H114 Cl8 S12 Si12 |
| Title of publication | Thiophene-Based Double Helices: Syntheses, X-ray Structures, and Chiroptical Properties. |
| Authors of publication | Zhang, Sheng; Liu, Xinming; Li, Chunli; Li, Lu; Song, Jinsheng; Shi, Jianwu; Morton, Martha; Rajca, Suchada; Rajca, Andrzej; Wang, Hua |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 31 |
| Pages of publication | 10002 - 10010 |
| a | 10.434 ± 0.009 Å |
| b | 15.47 ± 0.013 Å |
| c | 20.322 ± 0.017 Å |
| α | 89.347 ± 0.018° |
| β | 83.228 ± 0.017° |
| γ | 75.451 ± 0.016° |
| Cell volume | 3152 ± 5 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.2079 |
| Residual factor for significantly intense reflections | 0.0944 |
| Weighted residual factors for significantly intense reflections | 0.1803 |
| Weighted residual factors for all reflections included in the refinement | 0.2065 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.098 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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