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Information card for entry 4305300
Preview
| Coordinates | 4305300.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H50 Cl2 N3 O2 Ru |
|---|---|
| Calculated formula | C32 H50 Cl2 N3 O2 Ru |
| SMILES | [Ru]123(Cl)(Cl)Oc4ccccc4C=[N]2CC[N]3=Cc2ccccc2O1.[N+](CCCC)(CCCC)(CCCC)CCCC |
| Title of publication | General Synthesis of (Salen)ruthenium(III) Complexes via N...N Coupling of (Salen)ruthenium(VI) Nitrides |
| Authors of publication | Wai-Lun Man; Hoi-Ki Kwong; William W. Y. Lam; Jing Xiang; Tsz-Wing Wong; Wing-Hong Lam; Wing-Tak Wong; Shie-Ming Peng; Tai-Chu Lau |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2008 |
| Journal volume | 47 |
| Pages of publication | 5936 - 5944 |
| a | 11.817 ± 0.003 Å |
| b | 13.209 ± 0.003 Å |
| c | 22.033 ± 0.004 Å |
| α | 90° |
| β | 97.762 ± 0.019° |
| γ | 90° |
| Cell volume | 3407.6 ± 1.3 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1195 |
| Residual factor for significantly intense reflections | 0.0572 |
| Weighted residual factors for significantly intense reflections | 0.1574 |
| Weighted residual factors for all reflections included in the refinement | 0.1926 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.03 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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