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Information card for entry 4324910
Preview
| Coordinates | 4324910.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C97 H7 F42 N Sc3 |
|---|---|
| Calculated formula | C97 H7 F42 N Sc3 |
| Title of publication | Synthesis, Isolation, and Addition Patterns of Trifluoromethylated D5h and Ih Isomers of Sc3N@C80: Sc3N@D5h-C80(CF3)18 and Sc3N@Ih-C80(CF3)14 |
| Authors of publication | Shangfeng Yang; Chuanbao Chen; Mingzhi Jiao; Nadezhda B. Tamm; Maria A. Lanskikh; Erhard Kemnitz; Sergey I. Troyanov |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2011 |
| Journal volume | 50 |
| Pages of publication | 3766 - 3771 |
| a | 15.8238 ± 0.0005 Å |
| b | 19.541 ± 0.0006 Å |
| c | 21.2054 ± 0.0006 Å |
| α | 90° |
| β | 94.252 ± 0.001° |
| γ | 90° |
| Cell volume | 6538.9 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0623 |
| Residual factor for significantly intense reflections | 0.0577 |
| Weighted residual factors for significantly intense reflections | 0.1407 |
| Weighted residual factors for all reflections included in the refinement | 0.1434 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.058 |
| Diffraction radiation wavelength | 0.905 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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