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Information card for entry 4324911
Preview
| Coordinates | 4324911.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C101 H8 F42 N Sc3 |
|---|---|
| Calculated formula | C101 H8 F42 N Sc3 |
| Title of publication | Synthesis, Isolation, and Addition Patterns of Trifluoromethylated D5h and Ih Isomers of Sc3N@C80: Sc3N@D5h-C80(CF3)18 and Sc3N@Ih-C80(CF3)14 |
| Authors of publication | Shangfeng Yang; Chuanbao Chen; Mingzhi Jiao; Nadezhda B. Tamm; Maria A. Lanskikh; Erhard Kemnitz; Sergey I. Troyanov |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2011 |
| Journal volume | 50 |
| Pages of publication | 3766 - 3771 |
| a | 13.313 ± 0.001 Å |
| b | 14.278 ± 0.001 Å |
| c | 20.957 ± 0.001 Å |
| α | 80.6 ± 0.01° |
| β | 80.86 ± 0.01° |
| γ | 62.61 ± 0.01° |
| Cell volume | 3473.5 ± 0.5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.063 |
| Residual factor for significantly intense reflections | 0.0583 |
| Weighted residual factors for significantly intense reflections | 0.1345 |
| Weighted residual factors for all reflections included in the refinement | 0.1395 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.071 |
| Diffraction radiation wavelength | 0.905 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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