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Information card for entry 4333196
Preview
| Coordinates | 4333196.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H61 Cl2 Ni2 P4 |
|---|---|
| Calculated formula | C26 H61 Cl2 Ni2 P4 |
| SMILES | [Ni]12(Cl)[P](C(C)C)(C(C)C)C[P]([Ni](Cl)([P](C(C)C)(C(C)C)C[P]1(C(C)C)C(C)C)[H]2)(C(C)C)C(C)C |
| Title of publication | Structural Factors Influencing Linear M−H−M Bonding in Bis(dialkylphosphino)methane Complexes of Nickel |
| Authors of publication | Tyree, William S.; Vicic, David A.; Piccoli, Paula M. B.; Schultz, Arthur J. |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2006 |
| Journal volume | 45 |
| Journal issue | 22 |
| Pages of publication | 8853 - 8855 |
| a | 14.374 ± 0.009 Å |
| b | 14.995 ± 0.008 Å |
| c | 16.366 ± 0.017 Å |
| α | 90° |
| β | 94.557 ± 0.008° |
| γ | 90° |
| Cell volume | 3516 ± 5 Å3 |
| Cell temperature | 183 ± 2 K |
| Ambient diffraction temperature | 183 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/a 1 |
| Hall space group symbol | -P 2yab |
| Residual factor for all reflections | 0.038 |
| Residual factor for significantly intense reflections | 0.0345 |
| Weighted residual factors for significantly intense reflections | 0.0746 |
| Weighted residual factors for all reflections included in the refinement | 0.0762 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.175 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4333196.html
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Users of the data should acknowledge the original authors of the
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