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Information card for entry 4333197
Preview
| Coordinates | 4333197.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C50 H93 Br2 Ni2 P4 |
|---|---|
| Calculated formula | C50 H93 Br2 Ni2 P4 |
| SMILES | C1(CCCCC1)[P]1(C2CCCCC2)[Ni]2([P](C3CCCCC3)(C3CCCCC3)C[P](C3CCCCC3)(C3CCCCC3)[Ni]([H]2)([P](C2CCCCC2)(C2CCCCC2)C1)Br)Br |
| Title of publication | Structural Factors Influencing Linear M−H−M Bonding in Bis(dialkylphosphino)methane Complexes of Nickel |
| Authors of publication | Tyree, William S.; Vicic, David A.; Piccoli, Paula M. B.; Schultz, Arthur J. |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2006 |
| Journal volume | 45 |
| Journal issue | 22 |
| Pages of publication | 8853 - 8855 |
| a | 22.484 ± 0.005 Å |
| b | 22.484 ± 0.005 Å |
| c | 20.323 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 10274 ± 4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 88 |
| Hermann-Mauguin space group symbol | I 41/a :2 |
| Hall space group symbol | -I 4ad |
| Residual factor for all reflections | 0.1888 |
| Residual factor for significantly intense reflections | 0.1377 |
| Weighted residual factors for significantly intense reflections | 0.264 |
| Weighted residual factors for all reflections included in the refinement | 0.2944 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.253 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4333197.html
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