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Information card for entry 4346371
Preview
| Coordinates | 4346371.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H50 Cl P3 Se6 U |
|---|---|
| Calculated formula | C25 H50 Cl P3 Se6 U |
| SMILES | [U]123([Se]=P([Se]3)(C(C)C)C(C)C)([Se]=P([Se]1)(C(C)C)C(C)C)([Se]=P([Se]2)(C(C)C)C(C)C)Cl.c1ccc(cc1)C |
| Title of publication | Dithio- and Diselenophosphinate Thorium(IV) and Uranium(IV) Complexes: Molecular and Electronic Structures, Spectroscopy, and Transmetalation Reactivity. |
| Authors of publication | Behrle, Andrew C.; Kerridge, Andrew; Walensky, Justin R. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2015 |
| Journal volume | 54 |
| Journal issue | 24 |
| Pages of publication | 11625 - 11636 |
| a | 12.4588 ± 0.0012 Å |
| b | 14.439 ± 0.0014 Å |
| c | 21.264 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3825.2 ± 0.6 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0222 |
| Residual factor for significantly intense reflections | 0.0187 |
| Weighted residual factors for significantly intense reflections | 0.0386 |
| Weighted residual factors for all reflections included in the refinement | 0.0393 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.943 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4346371.html
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